open access

Vol 11, No 3 (2006)
Original papers
Published online: 2006-01-01
Submitted: 2005-10-07
Get Citation

Measurement of backscattered dose at metallic interfaces using high energy electron beams

Sanjay Sathiyan, M. Ravikumar, Sanjay S. Supe
DOI: 10.1016/S1507-1367(06)71056-2
·
Rep Pract Oncol Radiother 2006;11(3):117-121.

open access

Vol 11, No 3 (2006)
Original papers
Published online: 2006-01-01
Submitted: 2005-10-07

Abstract

Background

The amount of backscattered electrons depends on the thickness of the backscattering metal. The electron backscatter increases with the increase in thickness of the metal until a saturation level is reached and thereafter no change in scatter enhancement is noticed.

Aim

Electron backscatter effects at metallic interfaces were analysed in this study. High energy electron beams ranging from 6 to 20 MeV were used.

Materials/Methods

Measurements were carried out with a PTW thin-window parallel plate ionization chamber and an RDM-1F electrometer. Thin sheets of aluminium, copper and lead were used as inhomogeneities. The chamber was positioned below the inhomogeneities with the gantry maintained under the couch.

Results

The electron backscatter factor (EBSF) increases with increase in energy for aluminium, copper and lead. With low atomic number materials EBSF increases with increase in scatterer thickness and for lead it attains saturation within a few millimetres.

Conclusions

The information from this study could be useful in predicting the increase in dose at the metal-tissue interface due to electron backscatter.

Abstract

Background

The amount of backscattered electrons depends on the thickness of the backscattering metal. The electron backscatter increases with the increase in thickness of the metal until a saturation level is reached and thereafter no change in scatter enhancement is noticed.

Aim

Electron backscatter effects at metallic interfaces were analysed in this study. High energy electron beams ranging from 6 to 20 MeV were used.

Materials/Methods

Measurements were carried out with a PTW thin-window parallel plate ionization chamber and an RDM-1F electrometer. Thin sheets of aluminium, copper and lead were used as inhomogeneities. The chamber was positioned below the inhomogeneities with the gantry maintained under the couch.

Results

The electron backscatter factor (EBSF) increases with increase in energy for aluminium, copper and lead. With low atomic number materials EBSF increases with increase in scatterer thickness and for lead it attains saturation within a few millimetres.

Conclusions

The information from this study could be useful in predicting the increase in dose at the metal-tissue interface due to electron backscatter.

Get Citation

Keywords

metallic interface; electron backscatter; beam quality; heterogeneity

About this article
Title

Measurement of backscattered dose at metallic interfaces using high energy electron beams

Journal

Reports of Practical Oncology and Radiotherapy

Issue

Vol 11, No 3 (2006)

Pages

117-121

Published online

2006-01-01

DOI

10.1016/S1507-1367(06)71056-2

Bibliographic record

Rep Pract Oncol Radiother 2006;11(3):117-121.

Keywords

metallic interface
electron backscatter
beam quality
heterogeneity

Authors

Sanjay Sathiyan
M. Ravikumar
Sanjay S. Supe

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